Lambda News

Whilst working alongside machine vision system integrators, supporting end users and specifying systems for industrial applications the first question asked is ‘Do you really need a colour image?’ Why? Storing and handling data is a challenge and often a fight when working with inspection systems that need to run 24/7. If you can work in mono than we strongly encourage...

EssentOptics continues to work closely with its customers worldwide and add new features improving product performance, measurement results and day-to-day work satisfaction. The upgraded PHOTON RT will be showcased at the coming Laser World of Photonics 2015 exhibition in Munich, Germany (June 22-25, 2015). Throughout extensive field tests with customers, they continue to gather great recommendations on product improvements which are...

During the last few years diode lasers have replaced the Helium-Neon laser in many mass applications (e.g., barcode scanner, marking, adjusting, aligning). The global reduction in Helium-Neon laser sales means a great challenge for the few remaining manufacturers. Whereas, on the one hand, niche products require a resourceful mind to ensure the continuity of raw material supplies, on the other...

  The new version of PhotonSoft program features advanced capability to conduct group measurements of single and multiple substrates. Such function is of great value when determination of optimum angle of incidence for maximum optical performance is required. Measurement of a polariser using a sequence of 5 consecutive measurements of transmittance and reflectance. All of them are shown within one...

Optical profilers are interference microscopes, and are used to measure height variations – such as surface roughness – on surfaces with great precision using the wavelength of light as the ruler. Optical interference profiling is a well-established method of obtaining accurate surface measurements. Optical profiling uses the wave properties of light to compare the optical path difference between a test surface and a reference surface...

The NewView 8000 series of 3D optical surface profilers are the successors to the highly successful NewView 7000 series. Providing the user with powerful versatility in non-contact optical surface profiling, the NewView 8000 improves upon the impressive data collecting and manipulating abilities of the NewView 7000. Measurements are nondestructive, fast, and require no sample preparation. The latest 64 bit software...

NorPix introduces a new portable 4 camera high speed recording system for biomechanical applications. This new top of the line StreamPix based recording system can record from 4 synchronised cameras at speeds of up to 330 frames per second and a resolution of 2048x1088 in 8 bit format. Ideal for various applications in the field of biomechanics:  • Motion Capture •...

ZYGO's Verifire™ Series of laser Fizeau interferometers represent a complete line of high performance metrology instruments for the measurement of plano, spherical and aspherical surfaces and material characteristics. The systems provide a variety of proprietary acquisition techniques to ensure optimum metrology in a wide range of environments. For acquisition in turbulent environments, ZYGO offers the DynaFiz interferometer. While all Verifire™ models can...

2015 is upon us with its opportunities and challenges. To help you with these, Optic Metrology News aim to keep you up to date with new products, applications, solutions and companies we are working with. Last year Lambda linked up with some companies to broaden its Optic Metrology product line from the hopefully familiar Zygo Fizeau interferometers and Optical Profilers. One...

Researchers at Imperial College and Rolls-Royce have investigated the nature of blue corrosion areas in Ti alloys used in aerospace applications. After extensive investigation using Light Optical Microscopy (LOM) and Secondary Electron Imaging (SEI) they were able to identify the same blue area with both techniques. The LOM shows the area well but gives no surface topography, whereas because the...