Characterisation, Measurement & Analysis
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News

  • Bringing advanced automation to the forefront in the NEW Phenom XL G2 Desktop SEM

    Over the years, scanning electron microscopes (SEMs) have served as an important tool for quality control. Many of our Industrial Partners use SEMs to investigate defects and impurities at the microscopic level, to make accurate adjustments to the production process. Ensuring every product is built to the same high-quality standards.

    In the past, researchers have been required to perform the same repetitive steps to analyse every object; consuming valuable time, slowing down the production process, and increasing the risk of human error.

    New automation solutions within desktop SEMs are helping to solve these problems. Phenom desktop SEMs make it possible for users to perform in-house quality control while automating the repetitive steps in their workflows. The newly available Phenom XL G2 Desktop SEM takes automation to the next level; giving you the flexibility to customise the system and relay fast accurate information back to your team.

    The Phenom XL G2 Desktop SEM offers a versatile solution for automating the quality control process. Users can obtain high-quality images in just 40 seconds—three times faster than other desktop SEM systems on the market. Offering an improved resolution of 10 nanometers, the system enables more resolving power and the ability to explore large samples of up to 100 by 100 millimeters.

    The highly intuitive system extends quality checks to a broader number of users.

    A key feature of the Phenom XL G2 is its easy-to-use, intuitive user interface (UI) combining two screens into one for viewing images and performing analysis. With one simple click on the impurity, users can see what elements are present using the live energy-dispersive X-ray (EDS) analysis. The optical navigation camera makes it possible to view the entire sample while the user is in SEM mode.

    Requiring little lab space, the Phenom XL G2’s condensed size allows users to place the microscope exactly where it’s needed—whether that’s in the lab or on the production line for real-time analyses.

    With the Phenom XL G2, quality control managers can automate their repetitive workflow needed to analyse particles, pores, fibres, and large SEM images. The result is faster, more accurate analysis, more time for value-added work, and the assurance that only the highest quality products make it into customers’ hands.

    CLICK HERE to download the Phenom XL G2 datasheet.

     

    For further information, application support, demo or quotation requests  please contact us on 01582 764334 or click here to email.

  • Lambda Photometrics Ltd are proud to announce our new partner Tabor Electronics

    Tabor Electronics (est. 1971) has become a world-leading provider of high-end signal sources, featuring: RF, pulse, function, and arbitrary waveform generators/transceivers, high-voltage amplifiers, as well as waveform and modulation creation software. Tabor has earned global recognition for its highly-skilled workforce and innovative engineering capabilities.

    The company's extensive product portfolio includes high voltage signal amplifiers, pulse, function and arbitrary waveform generators, waveform creation software and more, in various platforms, interfaces and frequency ranges. Technologically advanced, featuring the highest levels of performance, reliability, and most of all, price-competitiveness, they are sought-after in a diverse array of applications.

    For further information on Tabor Electronics products from Lambda Photometrics click here.

    Lambda Photometrics is a leading UK distributor of Characterisation, Measurement and Analysis solutions with particular expertise in electronic test, semiconductor characterisation, scientific and analytical Instrumentation, laser and light based products, optics, electro-optic testing, spectroscopy, machine vision, optical metrology, fibre optics and microscopy.

    Lambda Photometrics have a strong presence within the UK and Ireland in Research and Development, Military and Defence, Academic Research and Industry helping support scientists and engineers with characterisation and test solutions for over 40 years.

    For further information, application support, demo or quotation requests  please contact us on 01582 764334 or click here to email.

  • POSTPONED ARMMS RF & Microwave Society Conference

    ARMMS RF & Microwave Society Conference.

    The society was formed in 1982. Although it now covers all aspects of RF and microwave engineering the society was originally focused on automated measurement and was named the "Automated RF & Microwave Measurement Society" (ARMMS).

    27-28th April 2020.

    Double Tree by Hilton Oxford Belfry

    Click here for more information.

     

     

     

  • POSTPONED - 33rd IEEE International Conference on Microelectronic Test Structures (ICMTS)

    33rd IEEE International Conference on Microelectronic Test Structures (ICMTS).

    The International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions.

    6-9th April 2020.

    University of Edinburgh

    Click here for more information.

     

     

     

  • POSTPONED - Faraday Joint Interest Group Conference 2020

    Faraday Joint Interest Group Conference 2020.

    Showcasing UK physical chemistry research.

    6-8th April 2020.

    University of Sheffield

    Click here for more information.

     

     

     

  • UK Semiconductors Conference 2020

    UK Semiconductors Conference 2020.

    An annual conference on all aspects of semiconductor research.

    8-9th July 2020.

    The Hallam Hall, Sheffield Hallam University.

    Click here for more information.

  • Electron Backscatter Diffraction 2021

    Electron Backscatter Diffraction 2021.

    The annual gathering draws together the whole Electron Backscatter Diffraction (EBSD) community, including leading international research scientists and engineers, early career researchers, and students to highlight the latest developments, from technique development through to applications.

    20th-21st April 2021.

    The Edge, Sheffield University.

    Click here for more information.

  • CANCELLED - UKIVA Machine Vision Conference

    UKIVA Machine Vision Conference.

    Thursday 14th May 2020,

    Marshall Arena, Milton Keynes.

    UKIVA Conference 

  • UK Catalysis Conference 2020

    UK Catalysis Conference 2020.

    The meeting will provide an opportunity for catalytic scientists and engineers from across the UK’s academic and industrial communities to interact and network over the whole spectrum of Catalysis ranging from Organocatalysis, Biocatalysis, Homogenous catalysis and Heterogeneous catalysis.

    7th - 9th January 2020.

    Holywell Park Conference Centre, Loughborough University Science & Enterprise Park, Loughborough.

    Click here for more exhibition information.

  • Photon 2020

    Photon 2020.

    Over four days, Photon participants will have the opportunity to visit exhibitions on the latest in optics and photonics technology, attend lectures from experts in the field, and get up to date with cutting-edge research.

    1st - 4th September 2020.

    East Midland Conference Centre, Nottingham, UK.

    Click here for more exhibition information.

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