Lambda News

Lambda is a leading supplier of characterisation, measurement and analysis equipment, applied to signals from DC to Light. Our company provides hardware, software and integrated solutions throughout the UK & Ireland.

  1. Elastic strain measurements

    High-resolution electron backscatter diffraction Backscatter electron contrast images (left) and elastic strain (Ɛxx normal strain component) maps (right) associated with the ɣ/ɣ’ interfaces in Ni-superalloy measured by high-resolution electron backscatter diffraction technique. Data were collected from the same area after mechanical polishing and after broad argon ion beam milling. High-resolution electron backscatter diffraction (HR-EBSD) strain measurements are very sensitive to...
  2. HAROGIC Technologies introduces the SAE-200

    HAROGIC Technologies, a company that develops miniaturized, high-performance RF test instruments, has introduced the SAE-200, a USB-based real-time spectrum analyser that operates from 9 kHz to 20 GHz with a 100 MHz bandwidth. It is an advanced RF instrument that meets the SWaP-C requirements - (S) Small Size, (W) Lightweight, weighs less than 200 g, (P) high-performance and (C) The unit costs £7,500...
  3. WEBINAR: How to Build a Quantum Computer

    Event hosted by FormFactor Cryogenic and Quantum Solutions May 23, 2024 Online event Quantum computing is reaching an inflection point. Once a technology developed and operated in experimental labs, it is now being manufactured by large-scale industrial companies. The commercialisation of superconducting quantum processing units (QPUs), FPGA-based microwave synthesis electronics, and ultra-low-temperature refrigerators has resulted in the realization of commercial-off-the-shelf, full-stack...
  4. Semplor - the new name for SEM's

    We are proud to announce the new company name from SEMPLOR, marking an exciting new chapter in their journey of growth and professionalism. They have decided it is time to rename Phe-nx and embrace a new company name that truly reflects their identity. With their state-of-the-art tabletop SEM, the NANOS, and a commitment to making SEM accessible to everyone, everywhere...
  5. TMC CleanTop® Advantages

    TMC's optical tables offer industry-leading performance and rigidity thanks to an all-steel construction and the highest core density and smallest honeycomb cell area on the market. CleanTop optical tops are used in a variety of applications, such as metrology, spectroscopy, photonics research, holography, quantum computing, high energy physics and interferometry. They come in standard sizes and shapes or can be...
  6. Quantum Computers: The Importance of Vibration Isolation

    TMC's Application Engineer, Dr Brian Keith, explains the importance of vibration isolation for quantum computers in an AZoQuantum interview. TMC's STACIS® Quiet Island What is the basic idea in quantum mechanics that quantum computers use? Quantum computers take advantage of quantum mechanics, an extremely successful fundamental theory in physics that describes the behavior of very small objects, objects at the...
  7. UKIVA Machine Vision Conference (MVC) & Exhibition

    The Machine Vision Conference (MVC) is globally recognised as the pre-eminent trade show in the field of machine vision. The upcoming 8th annual conference, on 18-19 June 2024 at the CBS Arena in Coventry, will showcase a diverse array of innovative machine vision and industrial technology, including exciting cutting-edge solutions from industry leading companies. Click here to register.
  8. Modular, mode-hop free solutions using external cavity Littman configurations

    Apex Technologies external cavity Littman tunable laser sources offer high performance across a wide tuning range, with high output power and high signal-to-noise ratio. Each laser chassis is designed to incorporate between 1 and 4 separate tunable laser options from the T-band to the extended C+L band. With each laser module covering a 110nm mode-hop-free tuning span and narrow linewidth...
  9. Controlled specimen thinning - Ar ion beam milling of a specimen prepared by Xe plasma FIB

    Cross-section and plan view specimens from a GeTe-based phase change memory device prepared using the Xe plasma focused ion beam tool (Xe pFIB), followed by concentrated Ar ion beam milling. Energy dispersive X-ray spectroscopy (EDS) data from the cross-section specimen confirms the removal of Xe pFIB damage after Ar ion beam milling from the marked area (yellow rectangle) in the...
  10. ARMMS RF & Microwave Society Conference

    18-19 November 2024 Monday 12:30 – Tuesday 16:00 Cambridge Belfry Hotel, Back Lane, Great Cambourne, Cambridge, CB23 6BW Email [email protected] or call on 01582 764334 if you would like to arrange a meeting.

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