Characterisation, Measurement & Analysis
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Lambda News

Lambda is a leading supplier of characterisation, measurement and analysis equipment, applied to signals from DC to Light. Our company provides hardware, software and integrated solutions throughout the UK & Ireland.

  • Bringing advanced automation to the forefront in the NEW Phenom XL G2 Desktop SEM

    Over the years, scanning electron microscopes (SEMs) have served as an important tool for quality control. Many of our Industrial Partners use SEMs to investigate defects and impurities at the microscopic level, to make accurate adjustments to the production process. Ensuring every product is built to the same high-quality standards.

    In the past, researchers have been required to perform the same repetitive steps to analyse every object; consuming valuable time, slowing down the production process, and increasing the risk of human error.

    New automation solutions within desktop SEMs are helping to solve these problems. Phenom desktop SEMs make it possible for users to perform in-house quality control while automating the repetitive steps in their workflows. The newly available Phenom XL G2 Desktop SEM takes automation to the next level; giving you the flexibility to customise the system and relay fast accurate information back to your team.

    The Phenom XL G2 Desktop SEM offers a versatile solution for automating the quality control process. Users can obtain high-quality images in just 40 seconds—three times faster than other desktop SEM systems on the market. Offering an improved resolution of 10 nanometers, the system enables more resolving power and the ability to explore large samples of up to 100 by 100 millimeters.

    The highly intuitive system extends quality checks to a broader number of users.

    A key feature of the Phenom XL G2 is its easy-to-use, intuitive user interface (UI) combining two screens into one for viewing images and performing analysis. With one simple click on the impurity, users can see what elements are present using the live energy-dispersive X-ray (EDS) analysis. The optical navigation camera makes it possible to view the entire sample while the user is in SEM mode.

    Requiring little lab space, the Phenom XL G2’s condensed size allows users to place the microscope exactly where it’s needed—whether that’s in the lab or on the production line for real-time analyses.

    With the Phenom XL G2, quality control managers can automate their repetitive workflow needed to analyse particles, pores, fibres, and large SEM images. The result is faster, more accurate analysis, more time for value-added work, and the assurance that only the highest quality products make it into customers’ hands.

    CLICK HERE to download the Phenom XL G2 datasheet.

     

    For further information, application support, demo or quotation requests  please contact us on 01582 764334 or click here to email.

  • Lambda Photometrics Ltd are proud to announce our new partner Tabor Electronics

    Tabor Electronics (est. 1971) has become a world-leading provider of high-end signal sources, featuring: RF, pulse, function, and arbitrary waveform generators/transceivers, high-voltage amplifiers, as well as waveform and modulation creation software. Tabor has earned global recognition for its highly-skilled workforce and innovative engineering capabilities.

    The company's extensive product portfolio includes high voltage signal amplifiers, pulse, function and arbitrary waveform generators, waveform creation software and more, in various platforms, interfaces and frequency ranges. Technologically advanced, featuring the highest levels of performance, reliability, and most of all, price-competitiveness, they are sought-after in a diverse array of applications.

    For further information on Tabor Electronics products from Lambda Photometrics click here.

    Lambda Photometrics is a leading UK distributor of Characterisation, Measurement and Analysis solutions with particular expertise in electronic test, semiconductor characterisation, scientific and analytical Instrumentation, laser and light based products, optics, electro-optic testing, spectroscopy, machine vision, optical metrology, fibre optics and microscopy.

    Lambda Photometrics have a strong presence within the UK and Ireland in Research and Development, Military and Defence, Academic Research and Industry helping support scientists and engineers with characterisation and test solutions for over 40 years.

    For further information, application support, demo or quotation requests  please contact us on 01582 764334 or click here to email.

  • A History of ZYGO Optical Profilers

    Some brief notes on the systems and technology over the years:

    Heterodyne profiler

    Maxim 5700: Micro Fizeau, tip/tilt in the head, PSI (Phase Shifting Interferometry), HPUX system controllers.

    Maxim 3D: PSI, 2 wavelengths for rougher surfaces, HPUX system controllers.

    NewView 100: The first Scanning White Light Interferometer (SWLI) from Zygo, uses Frequency Domain Analysis (FDA) to achieve high resolution over the entire scan range. 100 µm scan using PiFoc, open loop, finite conjugate objectives. HPUX system controllers. Standard microscope stand. Wyko RST was around during this time.

    NewView 200: Switch to infinite conjugate objectives that work with all future NewView’s, Nexview’s and ZeGage’s. Open-loop and closed-loop PiFoc piezo scanner, 100 µm range. HPUX system controllers. Standard microscope stand. Extended scan implemented.

    NewView 5000 series: Introduction of “A” frame designed using Finite Element Analysis (FEA) to minimise vibrations.  Used on all subsequent NewView systems.  Has extended scan to measure up to 5000 µm. Variable zoom. End of PC upgrade route due to frame-grabber board no longer being available.

    NewView 6000 series: Introduction of CAN bus electronics and away from Type II board. Fixed zoom and zoom turret available (NewView 6300).

    NewView 600: Low cost single objective system, manual stages.

    NewView 700: Low cost single objective system, manual stages.

    NewView 7000 series

    ZeMapper: Available after ZeMetrics acquisition. Good for large area parts such as hard disk drive substrates. Used ZeMaps software. Discontinued 2014.

    ZeScope: Available after ZeMetrics acquisition. Good for large volume parts such as larger engineering parts. Used ZeMaps software. Discontinued 2014.

    ZeGage: Jointly developed by Zygo and new ZeMetrics team. Used NewView optical head and ZeMaps software. Z scanner is non-piezo based. Migrated to new Mx software.

    Nexview: Flagship optical profiler from Zygo, and first to use new Mx software. Introduced many new features such as crash protection, colour imaging, the “More Data” concept, SmartPSI, oversampling, new 5.5x and 2.75x objectives, parfocal imaging, and full automation capability (including motorised filters and stops).

    NewView 8000 series: Introduces the new Mx software to the NewView family. Has many new features in common with the Nexview including crash protection, the “More Data” concept, oversampling, new 5.5x and 2.75x objectives, and parfocal imaging. Mx facilitates greater automation capability compared to previous profilers.

    ZeGage Pro and Pro HR, NewView 9000, Nexview NX2: Updated range of profilers with a new 1.9 MP high-sensitivity and high-speed sensor. Introduces fast focus technology and smart features such as ‘Find Part’ to automatically and rapidly focus on the surface – even over many millimetres of scan range – and ‘SmartSetup’ which extends the part finder by also detecting the optimal acquisition settings and taking the first measurement. This generation is available for demonstration by Lambda Photometrics.

  • POSTPONED ARMMS RF & Microwave Society Conference

    ARMMS RF & Microwave Society Conference.

    The society was formed in 1982. Although it now covers all aspects of RF and microwave engineering the society was originally focused on automated measurement and was named the "Automated RF & Microwave Measurement Society" (ARMMS).

    27-28th April 2020.

    Double Tree by Hilton Oxford Belfry

    Click here for more information.

     

     

     

  • POSTPONED - 33rd IEEE International Conference on Microelectronic Test Structures (ICMTS)

    33rd IEEE International Conference on Microelectronic Test Structures (ICMTS).

    The International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions.

    6-9th April 2020.

    University of Edinburgh

    Click here for more information.

     

     

     

  • POSTPONED - Faraday Joint Interest Group Conference 2020

    Faraday Joint Interest Group Conference 2020.

    Showcasing UK physical chemistry research.

    6-8th April 2020.

    University of Sheffield

    Click here for more information.

     

     

     

  • Fischione Model 1080 PicoMill® TEM specimen preparation system

    A guide for preparing TEM specimens for a demonstration of the Model 1080 PicoMill® TEM specimen preparation system at Fischione Instruments.

    The Fischione Model 1080 PicoMill® TEM specimen preparation system is ideal for specimen processing following focused ion beam (FIB) milling. The PicoMill system’s concentrated argon ion beam, typically in the energy range of 50 to 2000eV, excels at targeted milling and specimen surface damage removal. Ion induced secondary electron imaging is used to locate the FIB-produced lamella and then to target the region that will receive low energy milling in either raster or spot modes. Only the lamella is targeted during ion milling. Ion bombardment of the supporting grid is eliminated, which helps to prevent redeposition. The PicoMill system can also remove damage from electro polished or broad beam ion milled specimens.

    CLICK HERE to download the full Model 1080 PicoMill® TEM Specimen Preparation System Application Note.

    For further information, application support, demo or quotation requests  please contact us on 01582 764334 or click here to email.

    Lambda Photometrics is a leading UK Distributor of Characterisation, Measurement and Analysis solutions with particular expertise in Instrumentation, Laser and Light based products, Optics, Electro-optic Testing, Machine Vision, Optical Metrology, Fibre Optics and Microscopy.

  • UK Semiconductors Conference 2020

    UK Semiconductors Conference 2020.

    An annual conference on all aspects of semiconductor research.

    8-9th July 2020.

    The Hallam Hall, Sheffield Hallam University.

    Click here for more information.

  • Electron Backscatter Diffraction 2021

    Electron Backscatter Diffraction 2021.

    The annual gathering draws together the whole Electron Backscatter Diffraction (EBSD) community, including leading international research scientists and engineers, early career researchers, and students to highlight the latest developments, from technique development through to applications.

    20th-21st April 2021.

    The Edge, Sheffield University.

    Click here for more information.

  • CANCELLED - UKIVA Machine Vision Conference

    UKIVA Machine Vision Conference.

    Thursday 14th May 2020,

    Marshall Arena, Milton Keynes.

    UKIVA Conference 

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