Press Releases

Lambda's press releases

  1. Stanford Research Launch New Range of Products

     

    04 March 2008  

    We are proud to annouce the launch of the LDC501 Laser Diode Controller, the SR470/474 Optical Shutter Systems, the PTC10 Programmable Temperature Controller and PS300 20kV power supply from Stanford Research Systems.

     

    LDC501 Laser Diode Controller

    The LDC501 Laser Diode Controller is a highly stable, low-noise current source, with an integrated temperature controller — all at a very affordable price.

    The LDC501 is the ideal instrument for controlling the current and temperature of your laser diodes. It has the performance and features you expect from instruments costing twice as much.

    With a low-noise current source that delivers up to 500 mA, a 36 W high-precision temperature controller, and standard computer interfaces including Ethernet, the LDC501 is the right choice for your laser diode testing and control.  

     

     

    Laser Diode Controller    TEC Controller
    500 mA low-noise current source36 W output power
    Low drift (<10 ppm/°C)High stability 0.0005 °C/°C
    High bandwidth modulation (1.1 MHz)Thermistor, RTD and IC sensors
    Dynamic switching between CC and CP modesAuto-tuning of loop parameters
    GPIB, RS-232 and Ethernet interfacesDynamic switching between CT and CC modes 

     

    LDC501 Laser Diode Controller product page 

     

    SR470/SR474 Optical Shutter System

     

    SRS have introduced two new optical shutter systems — the SR470 Laser Shutter Controller and SR474 Four-Channel Laser Shutter Driver. These shutter systems are designed specifically to minimize vibration on your optical table.

    They are built around a unique shutter head, supported by one of two available controller models. The SR470 provides timing signals to a single shutter head, while the multi-channel SR474 drives up to four shutter heads, and is controlled by external timing signals.  

     

     

     

    • Ultra-low vibration shutter head
    • True mechanical laser beam blocking
    • >10 M cycle lifetime
    • Microprocessor controlled timing
    • DC to 125 Hz (any duty cycle)
    • Easy to align 3 mm aperture
    • GPIB, RS-232, Ethernet interfaces

     

    SR470/SR474 Optical Shutter System product page

     

    PTC10 Programmable Temperature Controller

    Introducing the PTC10 Programmable Temperature Controller from SRS — the ideal instrument for measuring temperature, controlling heaters, and logging temperature data.

    The PTC10 Programmable Temperature Controller is a modular system that can be configured to suit a wide range of applications. The system consists of the PTC10 Controller and up to four I/O cards — two types of input cards for RTDs and thermocouples, and two types of output cards for controlling heaters. The I/O cards are ordered separately, and you can mix and match them in any way you wish.    

     

    • Up to 16 input channels
    • Up to 4 PID feedback control channels
    • 50 Hz PID sampling
    • 1 mK resolution
    • Data logging on removeable flash media
    • USB, Ethernet, RS232 interfaces (std.)
    • GPIB interface (opt.)

     

    PTC10 Programmable Temperature Controller product page

     

    PS300 Series High Voltage Power Supplies

    The PS300 Series High Voltage Power Supplies — rugged, compact, reliable instruments for just about any high voltage application.

    With up to 20 kV output capability, a GPIB computer interface, and 0.001 % voltage regulation, these high voltage power supplies have become the industry standard.

    There are several models to choose from, with outputs ranging from 1.25 kV to 20 kV.

     

    •  +20 kV, -20 kV, +10 kV, -10 kV, ±5 kV, ±2.5 kV, ±1.25 kV supplies
    • 1 volt resolution
    • 0.001 % regulation
    • 0.05 % accuracy
    • Programmable limits and trips
    • 0.0015 % ripple
    • GPIB interface
    • RS-232 interface (10 kV & 20 kV models)

     

    PS300 Series High Voltage Power Supplies product page

     

  2. Stanford Research launch the SR1 Audio Analyser

     

    03 October 2008  

    The SR1 Dual-Domain Audio Analyzer is a stand-alone instrument that delivers cutting edge performance in a wide variety of audio measurements.

     

    SR1 uses an integrated computer running the Windows XP embedded operating system, so operation will be immediately familiar and intuitive.

    Depending on the application, SR1 can be operated with an external mouse and keyboard, or by using the front-panel knob, keypad and touchpad.  

     

    At the heart of SR1 is a uniquely flexible analog signal generator. All of the standard audio waveforms are available including sine, synchronous burst sine, noise (white, pink, and filtered), standard intermodulation test signals (SMPTE, CCIF, DIM), square waves, arbitrary waveforms (ASCII and .WAV), ramps and multitone waveforms. Many of these signals can be combined in the generator allowing you to create an unlimited number of test waveforms. 

     

    • = -108 dB THD+N (analog system at 1 kHz, 20 kHz BW)
    • 200 kHz (signal generation & measurements including FFTs)
    • = -114 dBu analog analyzer noise ( 20 kHz BW)
    • ± 0.008 dB flatness (analog system, 20 Hz to 20 kHz)
    • Low Crosstalk (= -140 dB analog inputs)
    • = 800 ps jitter (700 Hz to 100 kHz)
    • Dual-Channel FFTs  

     

    The same flexibility and performance is found in SR1’s digital audio signal generator. Almost all the same waveforms found in the analog generator are available in the digital generator with the addition of several special digital test waveforms including digital constant, walking bits, and a staircase waveform (for D/A testing).

    SR1 provides a complete set of measurements for digital interface testing. Carrier level and sampling frequency are measured directly. Status bits are fully decoded in both professional and consumer formats, and user bits are displayed as well.

    SR1’s Jitter Analyzer measures jitter in both the time and frequency domain, including continuously variable bandwidth limiting and weighting in both domains. For frequency domain measurements, live zoomable and heterodyned spectral displays of jitter are available. With a residual jitter of only 800 ps, the performance of SR1’s jitter analyzer is unbeatable.

    For more information or to request a quotation, please contact us

    Alternatively, please visit our SR1 Audio Analyser microsite  SR1 Audio Analyser microsite  

     

  3. Low Cost Fibre Cable Test Instrumentation

     

    07 Jun 2006  

    A new range of instrumentation is now available from Greenlee, a Textron company. The economically priced XLfiberTOOLS are designed to enable technicians to perform installation and maintenance measurements on fibre optic cabling networks. The instrument range comprises a power meter and two dual-wavelength sources and a visual fault finder. All of the products are rugged and splash-proof and easy to operate and intended for use in all environments. The instruments have only three buttons to control all functions, the visual fault finder has just a power on/off switch and a modulation on/off switch. All of the products feature an important Greenlee characteristic, excellent value for money.

    The 560XL power meter provides power measurements in dBm’s and loss measurements in dB’s with 0.01dB resolution and 0.25dB accuracy over the range -3dBm to -60dBm. Calibration is at four wavelengths between 850nm and 1550nm with a measurement data storage and recall feature to increase operational efficiency. The instrument has a long battery life with a user selectable auto shut-off period. With a price of only £265, the XL560 represents an outstanding price/performance ratio.

    The 570XL dual wavelength LED source has a calibrated output of -13dBm at 850nm and -20dBm at 1300nm with a stability of 0.05dB over a one hour period. The output may be CW or modulated at 1 kHz, 2 kHz or 270 kHz through an FC, SC or ST connector interface. Up to 80 hours of operation can be provided from 2 standard AA size 1.5V batteries with a user selectable auto shut-off. The price - £405.

    The 580XL laser source has outputs at 1310nm and 1550nm with minimum output levels of -8dBm and a one hour stability of 0.05dB. It shares many of the features of the LED source and is priced at £580.

    The model 170XL visual fault finder is a small lightweight device using a 635nm diode laser with a 1mW output as its visible source. It has the ability to find discontinuities in cables over a 3 km distance with a selectable modulated output to increase viewing contrast. An easy-to-use quick interface fits all 2.5mm connectors and an ergonomic rotary switch allows one-handed operation. Priced at £204, the 170XL is an economic and useful addition to any technician’s armoury.

    For more information contact Adrian Harrison on 01582 764334 Fax: 01582 712084 or email

     

  4. Smart Fibre Optic Cable Test Sets

     

    06 Jun 2006  

    A family of fibre cable loss sets has been introduced by Tempo, a US manufacturer of fibre optic test instrumentation. The Tempo 525 series is a rugged and dependable line of smart cable acceptance testing instruments designed for telecoms and datacoms high count cabling. The test sets provide the user with the easiest method of field testing of installed fibre optic cable.

    The range of features available in the four instrument series include automated, one button, bi-directional testing and optical return loss measurements with models for multi-mode or single-mode operation. Pass/fail thresholds can be set by the user and communication by messaging is possible between units in a test setup. The power meter element of the products has a wide dynamic range and is calibrated at seven widely used wavelengths between 850nm and 1625nm and has a resolution of 0.01dB with an absolute accuracy of 0.25dB. Two course wavelengths are provided on each model, 850nm and 1300nm on the multi-mode version, 1310nm and 1550nm on the single mode instrument. Information is displayed on a large backlit LCD screen with a sealed membrane permitting use in the harshest environments. An internal memory can store up to 1500 measurement records which can be downloaded to a database manager which can organise certification reports for printing. The software to facilitate the handling of test data is supplied with each instrument. An internal NiMH battery is capable of 8 hours of operation when fully charged. The Tempo 525 smart optical test set is delivered in a sturdy, field useable transit case which also contains an AC power adapter/battery charger, fibre cable connector adapters, an RS-232 data transfer cable, connector cleaning swabs and a reel of connector cleaner.

    For more information contact Adrian Harrison on 01582 764334 or email

    For more information on Fibre Optic products click here

  5. StreamPix Digital Video Recording Software

     

    04 Oct 2006  

    NorPix launches StreamPix 4, a multi-camera digital video recording software program with the ability to view, control and acquire multiple cameras from a single interface. The user interface of StreamPix 4 provides a complete management console for cameras, simplifying the setup, control and acquisition from any number and type of cameras, both locally and remotely connected.

    StreamPix 4 can support an infinite number of cameras. The number of cameras supported is limited by a condition wherein the combined data rate of the cameras exceeds the PCI bus bandwidth or processor capabilities of the computer.

    StreamPix supports a wide range of cameras and grabbers, including GigE, camera link, USB2 and IEEE 1394. In addition we provide a wide variety of features such as a VCR like user interface, Bayer conversion, export to various file formats, GPS or time stamping and many more.

    For more information, please contact us 

     

  6. Introducing VisiLine® and VisiLine® IP Kits

    Baumer expands its GigE camera series with 10 new IP protected models that have been developed for particularly demanding industrial environments. With the IP 65 and IP 67 protective housing, every sensitive camera component, all the way to the lens, is protected from dust, water spray and temporary immersion.

    Visiline IP 161013 small 

    The cameras have an x-coded M12 connection industrial design 12 to 24 volt or Power over Ethernet (PoE) supply. The GigE Vision compliant cameras feature CCD and CMOS sensors. High-performance SONY CCD sensors deliver up to 160 fps in VGA, 1.3 and 2 megapixel resolutions. Multi I/O 2  & 4 megapixel CMOS variants (CMOSIS CMV2000 and CMV4000) Frame rates of 55 respectively 29 fps. FPN (Fixed Pattern Noise) correction HDR (High Dynamic Range) Impressively homogenous images even in scenes with substantial brightness difference.

    Starter kits and power supply kits for the VisiLine® and VisiLine® IP series are available now.

    For more information, please click here to email or contact Clive Phillips  on 01582 764334.

    Lambda is a leading supplier of characterisation, measurement and analysis equipment, applied to signals from DC to Light. Our company provides hardware, software and integrated solutions throughout the UK & Ireland. Lambda’s scientists and engineers provide expert technical advice, working with you to improve; product discovery, product development and productivity. From fundamental materials research to volume manufacture, our consultative approach will ensure you receive the best advice and get the best solution for your needs. Lambda is a subsidiary of Polytec GmbH, a privately owned German technology company.

     

  7. Thin Film Thickness and Refractive Index Measurement Solutions from Lambda Photometrics

    20 Mar 2012

    Lambda Photometrics now provide a comprehensive range of equipment and measurement services for thin film characterisation and refractive index determination.

    Click here for more information.

    Metricon’s 2010/M instrument measures thickness and refractive index of thin films (~0.4 to 50 microns) using a prism coupling technique. It can also measure bulk refractive index at a number of specific laser wavelengths to yield Abbe Number and dispersion information. In addition measurement of liquids, polymers, waveguide loss, dual films and many more sample types is possible. For more information click here.

     

     

     

    SemiconSoft’s MProbe system measures the thickness of single and multilayer translucent film stacks. It is uses a non-contact spectroscopic technique and can be configured to measure layer thicknesses from 1nm to 1mm. Powerful multilayer thin film software is supplied with each system allowing complete modelling and measurement flexibility. Laboratory, at-line and on-line measurement solutions can all be developed with the same equipment. For more information click here.

     

     

     

     

    From M³ Measurement Solutions, we offer a measurement service for characterising refractive index, dispersion and dn/dT of optical materials.

    • Wavelength range: 350nm to 14µm
    • Temperature range: 77°K to 373°K

     

    This service is particularly useful for manufacturers of optical glasses, chalcogenide glasses, crystals and plastics as well as manufacturers and designers of optical components and systems. Accurate knowledge of these critical parameters can be the key to an optical system performing well in a real world environment. For more information click here.

     

    We have demonstration Metricon and SemiconSoft systems available for evaluation, so please contact us for solutions to your Thin Film Thickness and Refractive Index measurement needs.

    For further information and assistance, click here to email or contact: Matthew Ball on 01582 764334

  8. Lambda appointed by CI Systems: For all your Electro-Optic Testing Needs

     

    18 Jan 2012

    We are delighted to announce Lambda Photometrics has been appointed the new UK & Ireland representative for CI Systems Electro-Optics Division. 

    CI Systems have built up a solid reputation as a leading manufacturer of highly accurate and reliable Electro-Optic Test equipment for defence, scientific and industrial use. Customers include all the leading prime contractors, organisations and companies working in this field.

    With a comprehensive line-up of standard products we can offer a "one-stop shop" for all E-O testing and remote sensing needs.

     

    • Blackbodies & IR Targets
    • Collimators & FLIR testers
    • Laser Testers
    • Multi-Sensor Payload Testers
    • IR Field Testers
    • Boresight Systems
    • Missile Warning System Testers
    • IR Simulators
    • Remote Sensing Radiometers
    • Customised E-O Test Systems
    • Automatic Test Software  

     

    For customised solutions, we can utilise the experience of CI's team of physicists, engineers and software experts, working together with customers to ensure projects are delivered to specification, on time and within budget.

    We look forward to supporting the needs of all existing and future CI Systems customers in the UK & Ireland.

    For more information, please check out our Electro-Optic Testing pages.

    For further information and assistance, please contact Matthew Ball on 01582 764334 or click here to email 

     

     

  9. Breakthrough 3D Optical Profiler for Accurate Surface Metrology on the Production Floor

    20 Oct 2011

    Zemetrics, Inc., a Zygo Corporation company, introduces the ZeGage™ non-contact optical profiler for quantitative shop floor measurements of 3D form and roughness on precision machined surfaces.

    The ZeGage™ profiler eliminates the need for vibration isolation or specialized enclosures, resulting in footprint reduction, cost savings and increased ease of use. The industry-ready design produces fast, accurate metrology in a compact, cost-effective package. The ZeGage™'s proprietary SureScan™ technology enables high precision non-contact surface metrology while providing fast and accurate measurements in vibration-prone factory floor production environments.

     

     

     

    Additionally, the ZeGage™ profiler offers an easy to use through-the-lens focus aid for rapid part setup, and a heavy-duty sample stage with standard T-slots for part fixturing and optimal gauge-capable metrology. System versatility and areal measurements are enhanced with a wide range of field-of-view options, including manual or motorized turret options for mounting multiple objective lenses. A standard high-resolution 1 million pixel image sensor provides excellent surface detail and visualization.

    Windows® 7 64 bit-based ZeMaps™ analysis software, included with the ZeGage™ profiler, provides extensive 2D and 3D data analysis including form, step-height, and ISO/DIS 25178 compliant surface roughness parameters. ZeMaps™ interactive visualization tools enable fast, easy and thorough process characterization for a wide variety of surface metrology applications.

    Commenting on the ZeGage™ profiler functionality, John Roth, Zygo’s Director, Profiler Marketing, said “The ZeGage™ profiler is a major advance in 3D optical metrology, delivering performance, price and productivity to a wide range of industries, enabling the transition from contact, 2D instruments to the next-generation of affordable non-contact, 3D instruments. This system offers superior ease-of-use, speed, repeatability and accuracy, without surface contact or concern for environmental vibrations. With these unique advantages, the ZeGage™ profiler outperforms incumbent and competing technologies such as mechanical stylus profilometers.”

    With applications in industrial manufacturing, R&D, quality inspection, failure analysis and more, the ZeGage™ profiler provides advanced surface metrology for control of precision machining and micro-moulding processes across a wide range of industries, including automotive, medical and consumer electronics.
     
    Click here for further details.

    Please contact us for more information and to arrange a demo: click here to contact us by email or call:
     
    Graeme Gibbons or David Chambers on 01582 764334

     

  10. New Infrared material measurement service from Lambda Photometrics

    31 Oct 2011

    Lambda Photometrics is pleased to be offering the unique measuring services of M³ Measurement Solutions

    M³ Measurement Solutions provide measurement services for materials used for near to far infrared applications as well as down to the UV. They provide Refractive Index and Dispersions measurement services. They also provide RI as a function of temperature down to cryogenic temperatures to give dn/dT data. Optical materials which can benefit from such measurements include Silicon, Germanium, Zinc Sulphide, and Zinc Selenide as well as Chalcogenide glasses.

    Through the combination of high-end precision technology and intelligent software design, (M Cubed) optics metrology department now offers the following measurements:

    Tests

    •    Index of Refraction (RI)
    •    dn/dT (Refractive Index vs. Temperature Measurement)
    •    Dispersion (Refractive Index vs. Wavelength Measurement)
    •    Birefringence (Refractive Index Measurement of Anisotropic Materials)

     

    All of instruments are calibrated and NIST traceable. are currently in process of performing validation measurements with a SRM (Standard Reference Material) from NIST.

    Measurement Ranges

    provides refractive index measurements at wavelengths from 350nm to 14um, and temperature ranges from 77°K to +100°C (373°K).

    Measurement Method

    Refractive index is measured via a modified minimum deviation technique. In utilizing this technique, a small prism must be manufactured from the material under test. can sub-contract the prism manufacture or work with customers who wish to supply the finished prism substrate themselves.

    Data

    can provide data in many different formats depending on your specific needs. can supply various types of curve fitting and dispersion algorithms (e.g. Herzberger, Schott, Sellmeier etc). Full reports can be provided in Power Point, Word, PDF, and Excel formats.

    Accuracies

    can reach accuracies to the fourth and fifth decimal place depending on material type and sample configuration.

    To discuss your measurement requirements please contact Matthew Ball or Ken Middleton on 01582 764334.

    For more information on our products and services relating to Refractive Index and Thin Films click here to visit our webpage.

     

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