News

  1. WEBINAR: An easier, faster, and more accurate Ar ion milling technique for TEM specimen preparation

    Join us for a webinar where we introduce an advanced Ar ion milling technique designed to make your work easier, faster, and more accurate. Click here to view a recording of the event. Traditional Ga focused ion beam (FIB) and Xe plasma FIB milling often cause amorphization and leave ion-implanted layers on TEM specimens. Fischione Instruments’ NanoMill® TEM specimen preparation system has...
  2. Optical Profilers in an Argon Chamber Environment

    Did you know that you can now use Zygo Optical Profilers within argon chambers? This groundbreaking capability allows for precise metrology in controlled argon environments, commonly referred to as Argon Gloveboxes. This unique and thoroughly tested feature enables optical profiling under argon conditions, opening new possibilities for research and manufacturing applications. Argon chambers are indispensable tools in various research and...
  3. WEBINAR: Preparing APT specimens in a controlled environment

    Recording of webinar is now available - CLICK HERE.Join Fischione Instruments and NanoElectronic Imaging to learn more about a significant advancement in specimen preparation for STEM EBIC failure analysis. Electrical characterization and transmission electron microscopy (TEM) are crucial for semiconductor failure analysis. The scanning TEM electron beam-induced current (STEM-EBIC) imaging method integrates these techniques by performing electrical characterization at each...
  4. EMC and Compliance International

    19-21 May 2025 St Anne’s College, Oxford Universary,56 Woodstock Road, Oxford OX2 6HS he conference offers a dynamic platform for sharing the latest innovations and techniques in EMC, radio engineering, functional safety, electrical safety, and compliance. Featuring keynote sessions, workshops, tutorials and trainings, we’ll cover a broad range of topics, including measurement techniques, design for EMC, troubleshooting, and EMC for...
  5. Suppressing Back Surface Interference Fringes Using First Contact™ Black Polymer

    Lambda Photometrics is proud to serve as the exclusive B2B supplier of First Contact™ Polymer, further enhancing our product suite and reinforcing our commitment to comprehensive, high-quality solutions. This strategic partnership enriches Lambda's optical metrology portfolio by integrating a precise, reliable solution for optics cleaning, essential for accurate optical surface measurements. In this application note, we demonstrate the effectiveness of...
  6. Time to upgrade your laboratory equipment?

    Maximize your year-end budget with Fischione sample preparation products. As the fiscal year draws to a close, now is the perfect time to make the most of your remaining budget. We have a range of high-quality products that can help you improve your imaging and analyses in the coming year. Shark tooth image (right) before specimen mounting using the Model 180...
  7. Solve advanced signal generation scenarios easily with an RF/uW Arbitrary Waveform Generator (AWG)

    The Tabor Proteus AWG is a direct-to-RF/uW signal generation system – designed for complex signal scenario creation in Communication, Radar, and EW applications from DC to X-Band. Powerful Capability Proteus has a large memory, a state-of-the-art waveform scheduling system, and real-time streaming - providing long waveform playback. The optional transceiver includes an RF digitizer and programmable FPGA system making it...
  8. Elastic strain measurements

    High-resolution electron backscatter diffraction Backscatter electron contrast images (left) and elastic strain (Ɛxx normal strain component) maps (right) associated with the ɣ/ɣ’ interfaces in Ni-superalloy measured by high-resolution electron backscatter diffraction technique. Data were collected from the same area after mechanical polishing and after broad argon ion beam milling. High-resolution electron backscatter diffraction (HR-EBSD) strain measurements are very sensitive to...
  9. HAROGIC Technologies introduces the SAE-200

    HAROGIC Technologies, a company that develops miniaturized, high-performance RF test instruments, has introduced the SAE-200, a USB-based real-time spectrum analyser that operates from 9 kHz to 20 GHz with a 100 MHz bandwidth. It is an advanced RF instrument that meets the SWaP-C requirements - (S) Small Size, (W) Lightweight, weighs less than 200 g, (P) high-performance and (C) The unit costs £7,500...
  10. Semplor - the new name for SEM's

    We are proud to announce the new company name from SEMPLOR, marking an exciting new chapter in their journey of growth and professionalism. They have decided it is time to rename Phe-nx and embrace a new company name that truly reflects their identity. With their state-of-the-art tabletop SEM, the NANOS, and a commitment to making SEM accessible to everyone, everywhere...

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