Knowledge Base

The Model 2010/M’s ease in measuring thickness and index of relatively thick and optically absorbing films (including free-standing films) makes it an ideal tool for production or R&D measurements of photoresists, polyimides, or other polymers. In particular, the 2010/M’s routine ±.0005 index resolution (higher resolutions are available) makes possible routine monitoring of the overall processing consistency of these films with...

Multiple-wavelength operation is available for Metricon’s Model 2010/M to provide rapid and accurate curves of thin film and bulk material dispersion (index vs wavelength) similar to the results from a spectroscopic ellipsometer. If index is measured at three or more wavelengths a complete index vs wavelength (dispersion) curve can be easily generated in just a few seconds using the built...

The Metricon Model 2010/M is an ideal tool for developing surface plasmon resonance (SPR) and waveguide structures for use as bio- or other sensors. Such sensor devices usually rely on measuring the angular shift of an SPR resonance or waveguide propagation mode caused by the adsorption of thin layers of target materials on the surface of the sensor. A typical...

The Model 2010/M can operate as a fully-automated refractometer, providing high accuracy measurement of refractive index and index anisotropy for solid or liquid bulk materials and thick films in the index range 1.0 -2.6 without use of toxic or corrosive index matching fluids. This bulk material index measurement is not an option, but a standard feature provided with every system...

This option measures loss of optical wave guides by scanning a fibre optic probe and photodetector down the length of a propagating streak to measure the light intensity scattered from the surface of the guide. The assumption is that at every point on the propagating streak the light scattered from the surface and picked up by the fibre is proportional to the...

Metricon’s Model 2010/M system transforms prism coupling from an esoteric research technique into a routine laboratory analysis measurement. With the 2010/M, wave guide characterization data which typically requires a skilled professional an hour or more to collect with home made apparatus can now be obtained in 30 seconds or less in a format providing complete documentation of results and measurement...

The LASOS® LDM-XT laser series is the latest generation of laser diode modules that allows high resolution microscopy for both OEM and Laboratory applications.   Figure 5 LDM-XT laser diode module beam coupling options. LDM-XT can be delivered either (i) free-beam or (ii) by single mode fibre with direct modulation at frequencies up to 300 MHz. The LDM-XT are available in...

Whether your teaching first year or undergraduate electronics of RF Communications, Lambda can offer a selection of the latest test and measurement products from Rigol designed for College, University and Research establishments alike. Rigol offer the latest high specification equipment Oscilloscopes, Function Generators, DMM, Power supplies and Spectrum Analysers. Call us on 01582 764334 to speak to one of our...

Research and development, analysis, production, troubleshooting… all of these processes are moving faster than ever. Efficiency is the key to success. Rigol Technologies have been helping engineers for nearly 20 years to do more work, faster and with fewer resources. Their modern, flexible platforms are designed to satisfy a wide range of test and measurement applications. Rigol introduced a number...

LUNA’s Optical Vector Analyser (OVA) fully analyses the optical properties of fibre optic components, modules, and subsystems, providing comprehensive characterisation based on a complete transfer function measurement. This engineering note details how to use the OVA to characterise components in a production line setting. Click here to download the full article