Applications

Metricon’s Model 2010/M system transforms prism coupling from an esoteric research technique into a routine laboratory analysis measurement. With the 2010/M, wave guide characterization data which typically requires a skilled professional an hour or more to collect with home made apparatus can now be obtained in 30 seconds or less in a format providing complete documentation of results and measurement...

The LASOS® LDM-XT laser series is the latest generation of laser diode modules that allows high resolution microscopy for both OEM and Laboratory applications.   Figure 5 LDM-XT laser diode module beam coupling options. LDM-XT can be delivered either (i) free-beam or (ii) by single mode fibre with direct modulation at frequencies up to 300 MHz. The LDM-XT are available in...

Overview Planar optical waveguide technologies are the key elements in the modern, high speed optical network. Recent broad deployment of optical and hybrid optoelectronic chips and planar light circuits (PLCs) has been driven by the cost, size and operational benefits that these architectures offer. From a measurement perspective, planar optical waveguide architectures offer several unique challenges. Even the highest quality...

During the last few years diode lasers have replaced the Helium-Neon laser in many mass applications (e.g., barcode scanner, marking, adjusting, aligning). The global reduction in Helium-Neon laser sales means a great challenge for the few remaining manufacturers. Whereas, on the one hand, niche products require a resourceful mind to ensure the continuity of raw material supplies, on the other...

  The new version of PhotonSoft program features advanced capability to conduct group measurements of single and multiple substrates. Such function is of great value when determination of optimum angle of incidence for maximum optical performance is required. Measurement of a polariser using a sequence of 5 consecutive measurements of transmittance and reflectance. All of them are shown within one...

Optical profilers are interference microscopes, and are used to measure height variations – such as surface roughness – on surfaces with great precision using the wavelength of light as the ruler. Optical interference profiling is a well-established method of obtaining accurate surface measurements. Optical profiling uses the wave properties of light to compare the optical path difference between a test surface and a reference surface...

Laser - Creating Raman Scatter In Raman spectroscopy, it is essential to utilise a clean, narrow bandwidth laser due to the fact that the quality of the Raman peaks are directly affected by the sharpness and stability of the delivered light source. The i-Raman® spectrometer system features a patented CleanLaze® technology with a linewidth < 0.3nm when equipped with our 785nm and...