Optical Test & Contact Lens

The Model 2010/M can be used to measure thickness and index for one or both films of a dual film structure (as many as four film parameters) provided the top film has a higher refractive index than the lower film. Dual film measurements on transparent substrates or underlying (third layer) films are even possible in many cases. Detailed specifications for...

The accuracy of the Model 2010/M’s refractive index measurement makes possible monitoring of the concentration of phosphorus (and potentially other dopants) in PSG and BPSG films with a combination of speed, simplicity, and sensitivity unmatched by other techniques. The phosphorus monitoring application is based on the fact that as phosphorus concentration in SiO2 increases, refractive index also increases. For the...

The conventional way to measure index of contact or intraocular lenses is using an Abbe refractometer where the lens is not immersed in liquid. Advantages of using the Metricon Model 2010/M for measuring such lenses include: Maintains full hydration during measurement: A cell is available to allow the lens to be measured while it is completely immersed in hydrating fluid...

Option 2010-TC allows determination of temperature coefficient of refractive index by measuring index for thin films and bulk materials at temperatures as high as 200˚ C. Temperature coefficient data can also be used to calculate thermal expansion coefficients (Kang et al, Appl. Phys Lett. 81, 1438 (2002)). In the prism coupling technique, measurement of index at elevated temperature is complicated...

The Model 2010/M measures refractive index in machine (x), transverse (y), and perpendicular (z) directions for thin flexible polymer films and thicker bulk materials, permitting rapid and accurate determination of polymer density and crystallinity in approximately one minute. In-plane refractive index can also be measured along any arbitrary in-plane direction by a simple rotation of the sample about the coupling...

The Model 2010/M’s ease in measuring thickness and index of relatively thick and optically absorbing films (including free-standing films) makes it an ideal tool for production or R&D measurements of photoresists, polyimides, or other polymers. In particular, the 2010/M’s routine ±.0005 index resolution (higher resolutions are available) makes possible routine monitoring of the overall processing consistency of these films with...

Multiple-wavelength operation is available for Metricon’s Model 2010/M to provide rapid and accurate curves of thin film and bulk material dispersion (index vs wavelength) similar to the results from a spectroscopic ellipsometer. If index is measured at three or more wavelengths a complete index vs wavelength (dispersion) curve can be easily generated in just a few seconds using the built...

The Metricon Model 2010/M is an ideal tool for developing surface plasmon resonance (SPR) and waveguide structures for use as bio- or other sensors. Such sensor devices usually rely on measuring the angular shift of an SPR resonance or waveguide propagation mode caused by the adsorption of thin layers of target materials on the surface of the sensor. A typical...

The Model 2010/M can operate as a fully-automated refractometer, providing high accuracy measurement of refractive index and index anisotropy for solid or liquid bulk materials and thick films in the index range 1.0 -2.6 without use of toxic or corrosive index matching fluids. This bulk material index measurement is not an option, but a standard feature provided with every system...

This option measures loss of optical wave guides by scanning a fibre optic probe and photodetector down the length of a propagating streak to measure the light intensity scattered from the surface of the guide. The assumption is that at every point on the propagating streak the light scattered from the surface and picked up by the fibre is proportional to the...