Anne Fallon

  1. Innovations in Vibration Control: Enhancing Semiconductor Manufacturing Efficiency

    Moving stages are essential but challenging components in semiconductor and nanotechnology manufacturing. These stages, used in wafer inspection, lithography, metrology ,and other applications can cause significant vibration that can affect tool performance and throughput if it is not mitigated properly.In this interview, Elias Brassitos, Senior Control Systems Engineer at AMETEK, talks to AZoMaterials about these challenges and solutions. TMC works...
  2. Vibration Control Solutions for Microscopy

    The article "Vibration Control Solutions for Microscopy" focuses on the critical role of vibration control in ensuring accurate results in microscopy, especially for high-precision instruments like electron microscopes. Microscopes, particularly advanced models such as Scanning Electron Microscopes (SEM) or Atomic Force Microscopes (AFM), require extreme stability to capture high-resolution images. Even slight vibration from environmental factors such as nearby foot...
  3. Suppressing Back Surface Interference Fringes Using First Contact™ Black Polymer

    Lambda Photometrics is proud to serve as the exclusive B2B supplier of First Contact™ Polymer, further enhancing our product suite and reinforcing our commitment to comprehensive, high-quality solutions. This strategic partnership enriches Lambda's optical metrology portfolio by integrating a precise, reliable solution for optics cleaning, essential for accurate optical surface measurements. In this application note, we demonstrate the effectiveness of...
  4. Preparing APT Specimens in a Controlled Air Free Environment

    In this webinar, Fischione presented sample preparation and analyses workflow under controlled environments using broad Ar ion beam milling and Ga FIB, followed by concentrated Ar ion beam milling of metallic Mg APT specimens. Using Ar ion milling techniques (Model 1062 TrionMill and Model 1040 NanoMill® TEM specimen preparation system) on the bulk and APT specimens, surface damage and oxidation...
  5. WEBINAR: NFPKit Demonstration for EMC Pre-Compliance Testing

    Monday 11th November at 11amWe would like to invite you to join us for a live demonstration on the Near Field Probe Kit from Y.I.C. Technologies. The Near Field Probe Kit (NFPKit) is a unique and affordable solution to enhance product testing with reliable and accurate live scanning for highlighting EMC & EMI issues. The probes are used to locate...
  6. WEBINAR: Preparing APT specimens in a controlled environment

    Join us Tuesday, 12 November 2024 at 15.00 Successful correlative electron microscopy and atom probe tomography (APT) studies on metals require a surface and subsurface with minimal defects. The potential of these powerful analytical techniques can be hindered by surface damage during material processing, implanted Ga during focused ion beam (FIB) specimen preparation, or environmental degradation during specimen transfer in...
  7. Technical capabilities required to ensure successful vacuum window fabrication

    There are many factors which contribute to the successful manufacture of vacuum windows. The understanding and use of cutting-edge technology, quality control via state-of-the-art metrology tools, and understanding of material properties are all critical to their design and manufacture. When combined with a culture of innovation and in-depth and broad experience of precision optics manufacture, these technical capabilities can be...
  8. Time to upgrade your laboratory equipment?

    Maximize your year-end budget with Fischione sample preparation products. As the fiscal year draws to a close, now is the perfect time to make the most of your remaining budget. We have a range of high-quality products that can help you improve your imaging and analyses in the coming year. Shark tooth image (right) before specimen mounting using the Model 180...
  9. Ex situ lift-out specimen thinning

    Ar ion milling of specimens on carbon support grids The PicoMill system's scanning transmission electron microscope (STEM) detector images of EXLO specimens from a 20 nm NAND solid-state drive device. Before (first row, left) and after (first row, right) concentrated Ar ion beam milling images show an intact specimen while parts of the perforated carbon support were milled off. Bright-field TEM imaging before...
  10. Solve advanced signal generation scenarios easily with an RF/uW Arbitrary Waveform Generator (AWG)

    The Tabor Proteus AWG is a direct-to-RF/uW signal generation system – designed for complex signal scenario creation in Communication, Radar, and EW applications from DC to X-Band. Powerful Capability Proteus has a large memory, a state-of-the-art waveform scheduling system, and real-time streaming - providing long waveform playback. The optional transceiver includes an RF digitizer and programmable FPGA system making it...

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