Scanning Electron Microscopy (SEM) is essential for studying the microscopic morphology of minerals and fossils, as well as detecting microscopic structural features. SEM provides high-resolution imaging of mineral textures and crystal structures while enabling qualitative and semi-quantitative micro-area compositional analysis.

Figure 1 - BSE Image of Crystalline Rock, Eucentrically Tilted at 10°

Figure 1 presents a backscattered electron (BSE) image of a crystalline rock composed of Calcite and Pyrite. Crystalline rocks are characterized by a texture formed from interlocking crystals of one or more minerals or mineraloids. While most metamorphic and igneous rocks are crystalline, some sedimentary rocks also exhibit this texture.

With the high-performance BSE detector of the Semplor NANOS SEM, distinguishing between Calcite and Pyrite becomes straightforward. Calcite appears as darker grey crystals, while pyrite appears lighter due to differences in elemental composition. This detector features a four-quadrant design with fully controllable independent segments, allowing users to manipulate segment combinations to generate topographical images with a ‘shading effect.’ This effect enhances the visibility of crystal surfaces from multiple directions, revealing the roughness and depth variations within the sample, as demonstrated in Figure 2.

Figure 2 - BSE Image of Crystalline Rock in Topography Mode.

By leveraging the four independent segments of the NANOS BSE detector, four distinct topographical images can be captured. These images are then combined to produce an accurate 3D reconstruction of the sample’s surface, as illustrated in Figures 3 and 4. This advanced imaging capability significantly enhances the visualization and analysis of crystalline rock structures, offering deeper insights into mineral composition and morphology.

Figure 3 – 3D Reconstruction of Crystalline Rock Topography from BSE Image
Figure 4 – 3D Elevation Reconstruction of Crystalline Rock

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