High-resolution electron backscatter diffraction
High-resolution electron backscatter diffraction (HR-EBSD) strain measurements are very sensitive to diffraction pattern quality. Aside from intrinsic instrumentation limitations, sample preparation factors prominently into the accuracy and precision attained in HR-EBSD strain analyses. Surface contamination, oxidation, crystal lattice damage, and plastic deformation must be avoided during sample preparation to obtain accurate and precise measurements.
Broad Ar ion beam milling sample preparation using Fischione Instruments’ Model 1061 SEM Mill or Model 1062 TrionMill yields a lower average strain (up to two orders of magnitude) in comparison to mechanical polishing. Some grains accumulated more strain during mechanical polishing, which was attributed to the introduction of dislocations by plastic deformation. This is a result of local interactions with abrasives under the associated complex mechanical loading geometries during mechanical polishing.
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| Learn more: Webinar: Model 1062 TrionMill Nowakowski, P., Wiezorek, J., Spinelli, I., Ray, M., & Fischione, P. (2019). Elastic and plastic strain measurement using electron backscatter diffraction technique: The influence of sample preparation. Microscopy and Microanalysis, 25(S2), 534-535. Nowakowski, P., Wiezorek, J., Bathula, V., Mielo, S., Khanal, S., Bonifacio, C., & Fischione, P. (2018). SEM and TEM characterization of plastic deformation structures in aluminum by EBSD, TKD, and PED-based orientation imaging techniques. Microscopy and Microanalysis, 24(S1), 2182-2183. Nowakowski, P., Ray, M., & Fischione, P. (2022). Metrology of sample preparation for electron microscopy: Application to strain measurements. Microscopy and Microanalysis, 28(S1), 768-770. |
Lambda Photometrics is the leading UK Distributor of Characterisation, Measurement and Analysis solutions with particular expertise in Instrumentation, Laser & Light based products, Optics, Electro-optic Testing, Spectroscopy, Machine Vision, Optical Metrology, Fibre Optics, Microscopy and Anti-vibration tables & custom solutions
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Fischione Model 1061 SEM Mill (Ion Milling)
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Minimal maintenance -
Due to the efficiency of ionization, maintenance of the TrueFocus ion source is minimal and the components have an extremely long life. Material sputtered from the ion source is negligible, minimizing both sample contamination and component maintenance. Automated shuttering prevents the buildup of sputtered material on the viewing window. All system components are easily accessible for routine cleaning. - Programmable - Sample rotation is 360° with variable rotation speed and a sample rocking feature. The instrument automatically senses the sample thickness and establishes the milling plane, which maximizes throughput. A magnetic encoder provides absolute positioning accuracy.
- Automatic termination - The ion milling process can be automatically terminated by elapsed time or by temperature.
- Time - A timer allows milling to continue for a predetermined time and then turns off the energy to the ion sources when the time has elapsed. The sample remains under vacuum until the load lock is vented.
- Temperature - The thermal safeguard associated with the sample cooling system will stop the process if the sample stage reaches a preset temperature.
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