EssentOptics, a leading producer of UV-VIS-MWIR spectrophotometers for optical coaters, sets a new benchmark for the effective wavelength range of this type of spectrophotometer instrument and announces the expanded Mid Wave IR (MWIR) range configurations for its Photon RT spectrophotometers.
By Mid-wave Infrared (MWIR) we are referring to the 3 to 5 µm atmospheric window which is typically covered by detectors made of Indium Antimonide (InSb), Mercury Cadmium Telluride (HgCdTe, MCT) and Lead Selenide (PbSe).
The newly approved infrared source was developed and tested to meet growing customers' need for low-noise and repeatable optical measurements in Mid Wave IR. The tests results confirm its clear advantage over the traditional halogen lamp for 3.2-5.2 µm wavelength range measurement applications as it demonstrates both high signal stability and high illumination density. The signal-to-noise ratio is improved by a factor of greater 2 compared with the halogen lamp for the 3.4-4.2 µm wavelength range, and by greater than 5 times for the 4.5–5.2 µm wavelength range.
A team of EssentOptics experts analysed the IR signal quality of the spectrophotometer's baseline and performed test measurements for typical thin film coatings – a MWIR narrow bandpass filter and an aluminium mirror.
Baseline of the Spectrophotometer:
Test Measurements - Aluminium Mirror:
Test Measurements - Narrow Bandpass Filter, 4.85 µm.
The baselines measured with the new IR source demonstrate significantly higher stability and lower noise thus ensuring much better accuracy of measurements. Improved signal quality is also confirmed for variable angle and S/P polarisation-dependent measurements up to 5.2 µm, which is unattainable for any other instruments on the market.
Due to successful tests, the wavelength range of the PHOTON RT spectrophotometer will be expanded from 3.1 µm up to 3.5 µm, and from 4.9 µm up to 5.2 µm for the respective configurations of the instrument. The advanced configurations are offered to our customers without any price increase.
To speak with one of our Sales Engineers call 01582 764334 or to email click here.
Test Measurements - Aluminium Mirror:
Test Measurements - Narrow Bandpass Filter, 4.85 µm.
The baselines measured with the new IR source demonstrate significantly higher stability and lower noise thus ensuring much better accuracy of measurements. Improved signal quality is also confirmed for variable angle and S/P polarisation-dependent measurements up to 5.2 µm, which is unattainable for any other instruments on the market.
Due to successful tests, the wavelength range of the PHOTON RT spectrophotometer will be expanded from 3.1 µm up to 3.5 µm, and from 4.9 µm up to 5.2 µm for the respective configurations of the instrument. The advanced configurations are offered to our customers without any price increase.
To speak with one of our Sales Engineers call 01582 764334 or to email click here. Related Products
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EssentOptics PHOTON RT UV-VIS-NIR Spectrophotometer
The EssentOptics PHOTON RT UV-VIS-MWIR scanning spectrophotometer is a universal instrument designed specifically for unattended measurement of optical parts with coatings. The instrument can be produced in six configurations relative to the effective spectral range meeting individual customer measurement needs - from 380-1700 nm up to 185-5200 nm. World's first spectrophotometer designed for coaters. World's only instrument to feature UV-MWIR (220-5200 nm) polarisation measurement capability in a single device, a unique opportunity to get deeper insight into performance data of optical coatings.