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MProbe 20 Series: Thin Film Thickness Measurement

Product Code:
MProbe20
Manufacturer: Semiconsoft

The MProbe 20 series is a desktop system for thin-film thickness measurement. The measurement is based on spectroscopic reflectance and uses fiber optics retro-reflecting probe. This approach yields a compact, easy to use and affordable system.

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The system is user friendly and easy to setup – you will be ready to start measurements right away. Everything is included for samples measurement: spectrometer/ light source (main unit), fibre optics probe, sample stage, software, calibration/reference sample.

Our extensive materials library has 500+ materials. New materials can be easily imported or created/added to the library. Support for a wide range of parameterised materials (from Cauchy to Tauc-Lorentz, etc.) is included.

One-click measurement combines data acquisition and data analysis. 

For advanced users, we have all the sophisticated tools including sensitivity analysis, error-estimator, simulation, filmstack switching, global optimisation, layers and materials linking, etc. that can be used for advanced applications development.

Reflectance and transmittance spectral data can also be used as a raw measurement (for example, as in spectrophotometer) or for a wide range of other applications e.g. chemical concentration (we have a range of flow cells), filters and coating testing, etc.

Why use MProbe
Flexible: select the best hardware configuration for your application
Affordable: up to 50% savings as compared to other commercial instruments
Precision: unmatched precision <0.01nm or 0.01%
Materials database: extended database (500+ materials) is included
Software: flexible, user friendly and powerful software; integrated control/data acquisition and data analysis; any filmstack: no limits on number of layers, support inhomogeneous and thick incoherent layers, surface roughness, multi-sample analysis, etc.
Integration: several integration options are available: Modbus TCP, OPC (DA 2.0/3.0), custom options
Technical support: application and technical support

What’s in the box?

  • Main unit (includes spectrometer(s), light source, electronics)
  • Reflectance probe
  • Sample table with reflectance probe holder
  • TFCompanion -R software Advanced version (USB dongle (license key), Software, user guide and other materials on USB memory stick )
  • Calibration set: reference wafer (Si or Al depending on the model, or/and Quartz plate (optional)) and black absorber/pad
  • Test sample- 200nm oxide wafer
  • USB cable (connecting main unit to computer)
  • Universal power adapter (110V/220V)

In addition, MProbe includes the following Semiconsoft advantages:

  • Library with over 500 materials and support for parameterised materials
  • 12 months of free software updates and application support
  • Hardware upgrade program

System model can be selected based on the required thickness and/or wavelength range. Custom configurations that combine features of different models are available on request. Please let us know your application and we will offer a solution

 Basic Specification

 

Precision

Accuracy

Stability

Spot Size

Sample Size

0.1Å or 0.01% (greater of)

0.2% or 10A (greater of)

stability 0.2A or 0.02% (greater of)

2mm standard (optional to 20µm)

from 4mm

s.d. of 100 thickness reading of 100nm SiO2/Si calibration sample

filmstack dependent

2 sigma over 20 days (100 measurements daily) on 100nm/Si calibration sample

   

 System Configurations

Model

Wavelength range(nm)

Spectrometer/Detector

Lightsource

Thickness

Vis

400-1100

Spectrometer F4/Si CCD 3600 pixels/ ADC- 16 bit

Tungsten-Halogen

15nm- 75µm

UVVisSR

200-1100

Spectrometer F4/Si CCD 2048 pixels/ ADC- 16 bit

Deuterium/Tungsten-Halogen

1nm-75µm

HRVis

700-1000

Spectrometer F4/Si CCD 2048 pixels/ ADC- 16 bit /resolution

Tungsten-Halogen

1µm-400µm

UVVis-RT

200-1000

F4/Si CCD 2048 pixels/ ADC 16 bit/Optical Switch(Reflectance & Transmittance)

Tungsten-Halogen

1nm-75µm

NIR

900-1700

F2 Spectrometer InGaAs CCD 512 pixels: ADC- 16 bit

Tungsten-Halogen

50nm- 85µm

VisNIR

400-1700

Two spectrometer channels/ detectors (F4 Si 3600 pixels CCD and F2 InGaAs 512 pixels PDA) /ADC- 16 bit

Tungsten-Halogen

10nm- 85µm

UVVis-NIR

200-1700

Two spectrometer channels/ detectors (F4 Si 3600 pixels CCD and InGaAs 512)/ ADC – 16 bit

Deuterium/Tungsten-Halogen

1nm-85µm

VisXT

800-870

F4 spectrometer/Si 2048 pixels CCD

Tungsten-Halogen

10µm-1400 µm

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