Metricon Corporation has pioneered the practical application of prism coupling technology to problems of thin film, bulk material, and optical waveguide characterisation. Since its inception in 1980, more than 850 Metricon systems have been delivered to top universities, research institutes, and corporations in 38 countries. Metricon prism coupling systems have been referenced in hundreds of articles in scientific journals.
Metricon
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Refractive Index and Thin Film Thickness Measurement - Metricon Model 2010/M
The Metricon M2010/M Prism coupling system offers unmatched ease and accuracy for measuring:
- Refractive index and birefringence of bulk materials
- Refractive index and thickness of thin films
- Optical waveguide loss