EssentOptics PHOTON RT UV-VIS-NIR Spectrophotometer
The EssentOptics PHOTON RT UV-VIS-MWIR scanning spectrophotometer is a universal instrument designed specifically for unattended measurement of optical parts with coatings. The instrument can be produced in six configurations relative to the effective spectral range meeting individual customer measurement needs - from 380-1700 nm up to 185-5200 nm. World's first spectrophotometer designed for coaters. World's only instrument to feature UV-MWIR (220-5200 nm) polarisation measurement capability in a single device, a unique opportunity to get deeper insight into performance data of optical coatings.
PHOTON RT UV-VIS-MWIR SPECTROPHOTOMETER
- World's first spectrophotometer designed for optical coaters
- World's only instrument to feature UV to MWIR (220-5200 nm) polarization measurement capability, a unique opportunity offering deeper insight into real performance of optical coatings
The PHOTON RT UV-VIS-MWIR scanning spectrophotometer is designed specifically for unattended measurement of optical samples with coatings. The instrument is produced in six configurations relative to the effective wavelength range - from 185 nm up to 5200 nm.
KEY ADVANTAGES:
- Record wide wavelength range configuration in a single instrument: 185-5200 nm
- More than 10 times faster measurement compared to other tools on the market
- No need to re-calibrate the baseline after change of angle of incidence
- Measurement of transmittance and absolute specular reflectance from the same area on the substrate – perfect for backward analyses of thin film design
- The state-of-art measurement channel head represents the most complex and capable mechanism of its kind to be used for characterizing of coatings at different AOIs, polarizations, with wide range of angular beam deviation and beam displacement up to +/- 60 mm
- Fully unattended measurement of sophisticated single-element and cemented prisms: beamsplitters, dove prisms, right angle prisms, penta and half penta prisms, rhomboid prisms, roof prisms, Schmidt prisms, Pechan prisms. Prisms can be mounted or unmounted.
- Radically minimised human errors in the measurement process due to fully automated procedures.
Extensive QA/QC analysis, research and development of advanced thin film materials is supported with the built-in determination of refractive index dispersion, absorption index and layer thickness (nkd parameters) in the UV-Vis-NIR range with spectrophotometric reverse engineering. The PHOTON RT spectrophotometer ensures accurate measurements with a spectral resolution up to 1.2 nm and photometric accuracy up to 0.0002 in transmission mode meeting the modern requirements for demanding R&D applications and routine control tests.
The powerful configuration of the instrument fits into a compact housing and is very convenient both for routine and sophisticated QA/QC procedures. The instrument’s housing has a large lid providing easy access to the measuring compartment, allowing the optical part to be easily placed on the sample table.
APPLICATIONS:
- Polarising and beamsplitters cubes, X-cubes
- Broadband antireflective coatings
- Laser mirrors and standard flat mirrors
- Interference filters:
- Long pass
- Shortpass
- Dichroic
- Multi-band coatings
- Prisms and wedges
FEATURES AND CAPABILITIES (no external assemblies are required):
- Unique wavelength range configuration up to 220-5200 nm
- Build-in broadband high-contrast polarisers covering 220-5200 nm wavelength range
- Unique polariser configuration: S, P, S+P+(S+P)/2, Random and user-defined S:P ratio for incident beam
- Absolute specular reflectance measurement (R, Rs, Rp) for 8-75 deg AOI
- Transmittance measurement (T, Ts, Tp) for 0-75 deg AOI
- Unattended measurement and calculation of random polarisation T(s+p)/2 and R(s+p)/2
- Absorptance measurement of bare substrates
- Built-in beam displacement compensation for angular transmittance measurement of thick samples at high angles
- Unattended batch measurements of single and multiple samples
- Determination of complex refractive index and layer thickness (nkd parameters) for single-layer homogeneous coatings
- Average R and T values for user-selected wavelength range
- Integral R and T values adjusted for Type A illumination source and spectral sensitivity of human eye
- Optical density of the sample, 0 – 4 (D)
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PHOTON RT Multifunctional Spectrophotometer Technical Specifications |
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Product Configuration |
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Wavelength range, nm |
185 - 1700 |
185 - 3500 |
185 - 5200 |
380 - 1700 |
380 - 3500 |
380 - 5200 |
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PRODUCT SPECIFICATIONS |
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Optical scheme of monochromator |
Czerny-Turner |
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Optics |
Mirror, MgF2 |
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Reference channel |
Yes |
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Wavelength sampling pitch, nm |
0.1 - 100 |
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Wavelength scanning speed, nm/min |
3 000 (at 5 nm wavelength sampling pitch) |
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Spot size on the measured sample, mm |
User selected: 5 х 2 --> 2 x 2 |
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Turning pitch angle of sample stage |
0.01° |
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Turning pitch angle of photodetectors |
0.01° |
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Beam displacement compensation |
-60 mm ... 0 ... +60 mm (actual value depends on detector position) |
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Variable angle measurements |
1. 0 - 75°for transmittance (up to 85° with 70 - 85 sample stage) |
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2. 8 - 75°for absolute reflectance (up to 85° with 70 - 85 sample stage) |
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3. Detector rotation range: 300°... 180°... 16° |
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4. Sample stage rotation range: -85°... 0°... +85° |
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Wavelength subranges, nm |
Ultimate spectral resolution, nm (non-polarized light) |
Wavelength accuracy, nm |
Wavelength repeat accuracy, nm |
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185 - 350 nm |
0.3 |
+/-0.25 |
+/-0.125 |
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350 (380) - 990 nm |
0.6 |
+/-0.5 |
+/-0.25 |
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990 - 1650 nm |
1.2 |
+/-1.0 |
+/-0.5 |
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1650 - 2450 nm |
1.2 |
+/-1.0 |
+/-0.5 |
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2450 - 5200 nm |
2.4 |
+/-2.0 |
+/-2.0 |
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Stray light level, % at 532 nm |
˂0.1 |
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Angle of beam divergence |
+/-1° |
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Photometric accuracy |
(VIS) |
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NIST SRM 930e: +/-0.003 Abs (1Abs) |
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NIST SRM 1930: +/-0.003 Abs (0.33Abs); +/-0.006 Abs (2Abs) |
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(MWIR) |
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NRC NG11 SRM: +/-0,0013 Abs (0.13 Abs); +/-0.0053 Abs (0,49 Abs); +/-0.0011 Abs (0.82 Abs); +/-0.005 Abs (1.0 Abs) |
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Photometric repeat accuracy (VIS range) |
(VIS) |
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NIST SRM 930e: 0.0004 Abs (1 Abs) |
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NIST SRM 1930: 0.0001 Abs (0.33 Abs); 0.005 Abs (2 Abs) |
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(MWIR) |
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NRC NG11 SRM: +/-0.0003 Abs (0.13 Abs); +/-0.0008 Abs (0.49 Abs); +/-0.0022 Abs (0.82 Abs); +/-0.0034 Abs (1.0 Abs) |
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Determined using 0.1 second accumulation, maximum deviation for 10 subsequent measurements |
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Stability of baseline, %/hour (VIS range) |
˂0.1 (one hour warm-up time) |
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Unattended polarization measurements with built-in polarizers |
a. S, P, (S + P)/2, Random |
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b. User defined S:P ratio for incident beam (20/80, 30/70 etc) |
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Built-in polarizers, nm |
220 - 1700 |
220 - 3500 |
220 - 5200 |
380 - 1700 |
380 - 3500 |
380 - 5200 |
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Zero order / Green beam |
Built-in, automatic |
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Light sources, preinstalled |
1. Halogen lamp: 1 ea |
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2. HgAr wavelength calibration verification lamp: 1 ea |
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Deuterium lamp: 1 ea |
Deuterium lamp: 1 ea |
Deuterium lamp: 1 ea |
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IR source: 1 ea |
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IR source: 1 ea |
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Light sources, spare |
Halogen lamp: 2 ea (included with shipment). Other spare light sources can be ordered |
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SAMPLE COMPARTMENT |
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Dovetail baseplate for sample stages |
Designed for mounting of motorized and non-motorized sample stages. Integrated controller ensures instant detection of the motorized stage |
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Planar sample stage |
For measurement of transmission and reflection of planar samples with size bigger than 12x10 mm |
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Independent positioning |
Independent computer controlled positioning of sample stage and photodetectors unit |
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Synchronized positioning |
Synchronized computer controlled positioning of sample stage and photodetectors unit depending on the selected photometric function |
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Size of samples |
Min. 12x10 mm - for measurement at 0 - 10° incidence angles |
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Min. 12x25 mm - for measurement at 10 - 75° incidence angles |
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Max. sample size: |
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up to 152.4 mm (6") with closed lid for standard sample stage |
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up to 140.0 mm (5 1/2") with closed lid for Z sample stage |
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Sample stage for PBS cubes |
50x50x50 mm sample stage with two additional cube holders 1"x1"x1" and 1/2"x1/2"x1/2" |
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Optional motorized and non-motorized sample stage |
1. Multiposition Stage base, motorized, auto-detect |
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1.1 1" / 8 position disk for multiposition stage base |
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1.2 30 mm / 8 position disk for multiposition stage base |
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2. XY Stage. +/-12,5 mm travel. Sample size 40x44 mm |
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3. Z Stage |
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4. 70 - 85° AOI Sample Stage, not motorized (Photon Rt 1) |
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5. 70 - 85°AOI Sample Stage, not motorized (Photon Rt 2) |
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USER INTERFACE, DIMENSIONS AND WEIGHT |
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Interface |
USB 2.0, Windows-based, English |
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File saving formats |
res (txt), xls, pdf, csv |
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Power consumption, Watt |
110 |
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Power input |
110 - 220 V (+/-10%), 50 - 60 Hz |
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Purging |
Sample compartment, light sources, monochromator |
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Width х Depth х Height, mm (inches) |
422 х 656 х 285 (16 3/5" х 25 4/5" х 11 4/5"), including handle and feet |
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Net weight, kg (lbs) |
50 (110) |
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EssentOptics Photon Spectrophotometer datasheet | Photo | Product | SKU | |
|---|---|---|---|
 | EssentOptics LINZA 150 Spectrophotometer for Lenses and Lens Assemblies | - | > |
 | EssentOptics PHOTON RT Accessory: Standard Stage, Non-Motorised | - | > |
 | EssentOptics PHOTON RT Accessory: Standard Stage for Prism Measurements, Non-Motorised | - | > |
 | EssentOptics PHOTON RT Accessory: MP10 TR45 Stage, Multi-position, Motorised | - | > |
 | EssentOptics PHOTON RT Accessory: XY TR45 Stage, Motorised | - | > |
 | EssentOptics PHOTON RT Accessory: XY T10 Stage, Motorised | - | > |
 | EssentOptics PHOTON RT Accessory: R Stage, Motorised | - | > |
 | EssentOptics PHOTON RT Accessory: Z Stage, Motorised | - | > |
 | EssentOptics PHOTON RT Accessory: 7085 Stage, Non-Motorised | - | > |
 | EssentOptics PHOTON RT Accessory: QW Stage, Non-Motorised | - | > |
